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This study aims to calculate the refractive indices and optical dispersion of silicates using a novel small-prism technique. Utilizing prisms with thicknesses of 1-2mm, held by a ceramic sample holder and illuminated by a Hg–Cd light source, we determined the refractive indices at λ = 589.3 nm and for infinite wavelength using the Sellmeier equation. This paper presents the results of these measurements, providing insights into the optical properties of silicates.
Accurate refractive indices and optical dispersion are very useful for many purposes that are listed below:
By using values one can find the theoretical n calculations.
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A good relationship between the nonlinear refractive index coefficient() and the linear refractive index(n) magnitude and dispersion can be useful for the estimation of approximate glass and crystalline material values.
The study utilized several silicate samples, as detailed in Table 1 below.
Table 1: List of Silicate Samples Used in the Study
| Name of Sample | Composition | Origin |
|---|---|---|
| Quartz X-13 | SiO2 | Synthetic, colorless |
| Quartz X-488 | SiO2 | Synthetic, colorless |
| Smoky Quartz | SiO2 | Light brown |
| Quartz X-0 | SiO2 | Synthetic, colorless |
| Quartz BTL | SiO2 | Synthetic, colorless |
| Amethy1 | SiO2 | Light violet, Brazil |
| Amethy2 | SiO2 | Violet, Zambia |
For calculating refractive indices and optical dispersion An optical two-circle goniometer (Stoe Type F 2.13.0) with a polarizing device and microscope optics, was used and vertical circle is eliminated to increase the accuracy of the measurement.In this Experiment the deviation of light is measured in in two symmetric positions by displacement of both the prism and the light source to the both sides Left side as well as right side.
This leds to an increase of measurement accuracy by resulting a value of twice the angle of minimum deviation values in 2d instead of d measured the deviation of the light beam
The light source was a Hg–Cd spectral lamp, which emits 8 lines covering the range 643.8–404.7 nm. Although it would have been desirable to extend the dispersion measurements to longer wavelengths, the light source and apparatus did not permit that option. Prisms with faces with 1 mm 3 1 mm cross section give sharp and well-defined lines when they are prepared in the manner described below. Smaller faces result in a broadening of lines, as described by Leiss.
Samples were prepared using a MACOR ceramic holder designed for holding eight specimens simultaneously. This holder facilitated the efficient preparation and analysis of multiple samples.
The Sellmeier coefficient, along with the calculated refractive indices at λ = 589.3 nm and for infinite wavelength (λ = ∞), are presented in the following table.
Table 2: Sellmeier Coefficients and Calculated Refractive Indices
| Name of Crystal | Sellmeier Coefficient A | Refractive Index at λ = 589.3 nm | Refractive Index at λ = ∞ |
|---|---|---|---|
| Quartz X-13 | 65 | 1.5441 | 1.5413 |
| Quartz X-488 | 65 | 1.5441 | 1.5416 |
| Smoky Quartz | 64 | 1.5443 | 1.5417 |
| Quartz X-0 | 65 | 1.5441 | 1.5412 |
| Quartz BTL | 65 | 1.5442 | 1.5416 |
| Amethy1 | 65 | 1.5444 | 1.5415 |
| Amethy2 | 65 | 1.5444 | 1.5418 |
The Sellmeier equation was successfully applied to model the dispersion in the visible region, providing a comprehensive understanding of the optical properties of the studied silicates.
The small-prism technique demonstrated in this study offers a precise method for calculating the refractive indices and optical dispersion of silicates. The data obtained provides valuable insights into the materials' optical properties, contributing to the broader knowledge of silicate materials and their applications in optical technologies.
The Calculation of Refractive Indices and Optical Dispersion Using Prism Technique. (2024, Feb 16). Retrieved from https://studymoose.com/document/the-calculation-of-refractive-indices-and-optical-dispersion-using-prism-technique
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